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Back to Back Multiprobe system for Thickness measurement

Surface statement and form metrology Tech. Specs : Max.f.dev. h=200mm inf. 4µ/100mm Back to back multiprobe measurement Multi-track optics 3 mm, 300µ, CCD Thickness, back to back measurement with 2 symmetric probes to sync the 2 profiles and surfaces DC motorized axis Applications Top-Down-Thickness 3D cartography Thickness of transparent films Scores metrology

  • SKU : I-B32-Altisurf Twin
  • Manufacturer: Altimet
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  • Surface statement and form metrology
  • Tech. Specs :
    • Max.f.dev. h=200mm inf. 4µ/100mm
  • Back to back multiprobe measurement
  • Multi-track optics 3 mm, 300µ, CCD
    • Thickness, back to back measurement with 2 symmetric probes to sync the 2 profiles and surfaces
  • DC motorized axis
  • Applications
    • Top-Down-Thickness
    • 3D cartography
    • Thickness of transparent films
    • Scores metrology