Votre leader canadien en instrumentation depuis 1946.

Système d’inspection compact à port de charge unique

A compact solution for 300mm wafer inspection in diverse applications.   Engineered to provide cost-effective support for 300mm wafers with a minimal footprint, the Optistation-3100 features an advanced micro/macro system in a compact, flexible design. The optical system offers brighter images, and observation techniques can be programmed for each objective magnification […]

Posez une question sur ce produit

A compact solution for 300mm wafer inspection in diverse applications.


 


Engineered to provide cost-effective support for 300mm wafers with a minimal footprint, the Optistation-3100 features an advanced micro/macro system in a compact, flexible design. The optical system offers brighter images, and observation techniques can be programmed for each objective magnification and each substrate layer to be inspected.