Surface statement and form metrology Tech. Specs : Max.f.dev. h=200mm inf. 4µ/100mm Back to back multiprobe measurement Multi-track optics 3 mm, 300µ, CCD Thickness, back to back measurement with 2 symmetric probes to sync the 2 profiles and surfaces DC motorized axis Applications Top-Down-Thickness 3D cartography Thickness of transparent films Scores metrology
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