Accurate sub-nano-surface profiler with non-contact measurement Nikon’s proprietary scanning-type optical interference measurement technology achieves 1 picometer (pm) height resolution. Nikon offers a variety of optical microscopes as measurement systems to suit a wide range of measurement applications. Key benefits Superior measurement performance Realizes 0.1 nm-level measurements of ultra-smooth surfaces with neither averaging nor filtering process. […]
Wide range of observation methods
High Speed Model | ||||||
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BW-D501 | BW-D502 | BW-D503 | BW-D505 | BW-D506 | BW-D507 | |
Measurement optical system | Focus Variation with White Light Interferometry (FVWLI) | |||||
Height resolution (algorithm) | 1 pm (0.001 nm) | |||||
Step height measurement reproducibility | σ: 8nm / 8μm step height measurement | |||||
Number of pixels | 510x510 | |||||
Height measurement time | 4 s / 10 μm scan | |||||
Height measurement range | < 90 μm | < 20 mm | < 90 μm | < 20 mm | ||
Measurement field size | < 2015 x 2015 μm * | |||||
Piezo actuator | Objective lens driven | Nosepiece driven | ||||
Z axis | Manual | Electric | Manual | Electric | ||
XY axis | Manual | Electric | Manual | Electric | ||
Software | Bridgelements® software modules |
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